- 彭健育
Publications
 
Papers
  • (Peng, C. Y.)*, 2015, Optimal classification policy and comparisons for highly reliable products, Sankhya B (IF 0).
  • (Peng, C. Y.)*, 2012-04, A Note on Optimal Allocations for the Second Elementary Symmetric Function with Applications for Optimal Reliability Design, Naval Research Logistics, 59(3-4), 278-284, [SCI] (IF 0.692).
  • (Peng, C. Y.)*, Hsu, S. C., 2012-04, A Note on a Wiener Process with Measurement Error, Applied Mathematics Letters, 25(4), 729-732, [SCI] (IF 1.501).
  • Cheng, Y. S., (Peng, C. Y.)*, 2012-06, Integrated Degradation Models in R Using iDEMO, Journal of Statistical Software, 49(2), 1-22, [SCI] (IF 4.91).
  • (Peng, C. Y.), Tseng, S. T.*, 2013-06, Statistical Lifetime Inference with Skew-Wiener Linear Degradation Models, IEEE Transactions on Reliability, 62(2), 338-350, [SCI] (IF 2.293).
  • Yu, H. F.*, (Peng, C. Y.), 2013-06, Estimation for Weibull Distribution with Type II Highly Censored Data, Quality Technology and Quantitative Management, 10(2), 193-202, [SCI] (IF 0.193).
  • (Peng, C. Y.)*, 2013-09, The first negative moment of skew-$t$ and generalized Student's-$t$ distributions in the principal value sense, Journal of Applied Mathematics, Article ID 732875. doi:10.1155/2013/, [SCI] (IF 0.834).
  • (Peng, C. Y.), Wu, C. F. Jeff*, 2014-03, On the Choice of Nugget in Kriging Modeling for Deterministic Computer Experiments, Journal of Computational and Graphical Statistics, 23(1), 151-168, [SCI] (IF 1.269).
  • Yu, H. F.*, (Peng, C. Y.), 2014-04, Designing a Degradation Test with a Two-parameter Exponential Lifetime Distribution, Communications in Statistics - Simulation and Computation, 43(8), 1938-1958, [SCI] (IF 0.295).
  • D’Hondt, M., Fedorova, M., (Peng, C. Y.), Gevaert, B., Taevernier, L., Hoffmann, R. and Spiegeleer, B. D.*, 2014-06, Dry heat forced degradation of buserelin peptide: kinetics and degradant profiling, International Journal of Pharmaceutics, 467(1-2), 48-59, [SCI] (IF 3.458).
  • (Peng, C. Y.)*, 2015-03, Inverse Gaussian Processes with Random Effects and Explanatory Variables for Degradation Data, Technometrics, 57(1), 100-111, [SCI] (IF 1.424).
  • Peng, C. Y. and Tseng, S. T.*, 2010-03, Progressive-stress Accelerated degradation Test for Highly-reliable products, IEEE Transactions on Reliability, [SCI].
  • Peng, C. Y. and Tseng, S. T.*, 2009-09, Mis-specification Analysis of Linear Degradation Models, IEEE Transactions on Reliability, 58, 444-455, [SCI].
  • Peng, C. Y.*, 2008-09, The First Negative Moment in the Sense of the Cauchy Principal Value, Statistics and Probability Letters, 78, 1765-1774, [SCI] (IF 0.445).
  • Tseng, S. T.* and Peng, C. Y., 2007-07, Stochastic Diffusion Modeling of Degradation Data, Journal of Data Science, 5, 315-333.
  • Tseng, S. T.* and Peng, C. Y., 2004-12, Optimal burn-in policy by using integrated Wiener process, IIE Transactions, 36, 1161-1170, [SCI] (IF 0.503).
  • Peng, C. Y. and Cheng, S. W.*, 2004-12, An Introduction to Indicator Function, Journal of the Chinese Statistical Association, 42, 329-348, [其他].
  • Tseng, S. T.*, Peng, C. Y. and Liu, C. M. , 2004-06, Optimal Design of a Non-linear Degradation Test, Journal of the Chinese Statistical Association, 42, 115-130, [其他].
Book Chapters
  • (Peng, C. Y.)*, Cheng, Y. S., 2015, Threshold degradation in R using iDEMO, Computational Network Analysis with R.