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Seminars

Control Charts for Monitoring the Lognormal Mean and Standard Deviation

  • 2020-08-03 (Mon.), 10:00 AM
  • R6005, Research Center for Environmental Changes Building
  • Prof. Wei-Heng Huang
  • Department of Statistics, Feng Chia University

Abstract

The Shewhart X-bar- and S-charts are most commonly used for monitoring the process mean and variability based on the assumption of normality. However, many process distributions may follow a positively-skewed distribution such as the lognormal distribution. In this study, we discuss the construction of three combined X-bar- and S-charts for jointly monitoring the lognormal mean and the standard deviation. The simulation results show that the combined lognormal X-bar- and S-charts are more effective when the lognormal distribution is more skewed. A real example is used to demonstrate how the combined lognormal X-bar- and S-charts can be applied in practice. ? Keywords:Average run length; Lognormal distribution; Phase II monitoring; S-chart; X-bar-chart.

Update:2024-12-10 16:19
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