Recent Advances in Optimal Design for One-Shot Devices

Abstract

Accelerated life tests (ALTs) have gained increasing attention from both industry and academia as effective tools for inducing rapid product failures and collecting rich failure data for reliability assessment. This presentation reports new results on optimal design strategies for step-stress ALTs for one-shot devices. Specifically, we consider optimal designs with multiple stress levels, hybrid group censoring, and unified accelerated life tests. In this talk, I will present a method to determine the optimal inspection times and to optimally allocate test items across different stress levels for step-stress ALTs with multiple stress levels. I further present an approach to obtain the optimal stopping threshold when hybrid group censoring is incorporated, yielding a practical decision rule for terminating the experiment based on the number of observed failures. Finally, I propose a novel testing methodology—unified accelerated life testing—that integrates the principles of constant-stress ALTs and step-stress ALTs.

References

Tung, H.P., Ling, M.H. Unified accelerated life testing for one-shot devices with Weibull lifetime distributions, IEEE Transactions on Reliability, 75, 171-180, 2026.

Ling, M.H., Cramer, E., Bae, S.J. Statistical inference and optimal design for step-stress accelerated life testing with hybrid group censoring for non-destructive one-shot devices, Reliability Engineering & System Safety, 265, 111506, 2026.

Ling, M.H. Optimal designs of multiple step-stress accelerated life tests for one-shot devices with Weibull lifetime distributions, IEEE Transactions on Reliability, 74, 3017-3027, 2025.

Balakrishnan, N., Ling, M.H., So, H.Y. Accelerated Life Testing of One-shot Devices: Data Collection and Analysis, John Wiley & Sons, Hoboken, New Jersey, 2021.

Please click here for participating the talk online.